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RS2404_X-RAY_GOLDSCOPE_SD Pro_SDD_SDD Pro_mit Schlagschatten
Gold Testing Machine
XAN220

Goldscope SD520

X-Ray Fluorescence Measuring Instruments
Optimized for Fast, Cost-effective and Non-destructive
Analysis of Jewelry, Coins and Precious Metals

-Refineries, assaying
offices and hallmarking centers

Enquiry by phone

The X-ray fluorescence measuring instruments of the GOLDSCOPE SD series are optimized
for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals.
Furthermore, the instruments are well suited for determining the thickness of gold coatings
on sterling silver and rhodium coatings on gold alloys.
The GOLDSCOPE SD series comprises four different instruments to fulfill the specific
demands from the fast purchase and sale of gold up to the high-precision analysis of
precious metals.
Typical fields of application are the analysis of:
• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
Outstanding accuracy and long-term stability are characteristics of all X-RAY systems from
FISCHER. The necessity of recalibration is considerably reduced, saving time and effort.
The GOLDSCOPE SD 510 and SD 515 instruments are equipped with a modern silicon PIN
detector, which achieves high accuracy and good detection sensitivity. For even higher resolution, the GOLDSCOPE SD 520 and SD 550 instruments with their Silicon Drift Detectors
(SDD) are available.
The fundamental parameter method by FISCHER allows for the analysis without calibration

General Specification
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals

GOLDSCOPE SD 520: Bench top unit with upwards opening hood

Measuring direction: Bottom up

Electrical Data

Power supply and consumption: AC 115 or 230 V, 50/60 Hz, max. 120 W without evaluation PC

Protection class: IP40

Environmental Conditions
Operating temperature: 10 °C – 45 °C / 50 °F – 113 °F
Storage/Transport temperature: 0 °C – 50 °C / 32 °F – 122 °F
Relative humidity: ≤ 95 %

Sample Alignment
Sample positioning: Manually
Video microscope: High-resolution CCD color camera for optical monitoring of the measurement location
along the primary beam axis, Crosshairs with a calibrated scale (ruler) and spot-indicator,
Adjustable LED illumination
Zoom factor Digital: 1x, 2x, 3x, 4x

Evaluation Unit
Computer: Windows®-PC
Software: WinFTM® optimized for GOLDSCOPE SD, including Gold Setup GOLDSCOPE with
measuring applications for gold and jewelry

Standards

CE approval: EN 61010, EN 61326

X-Ray standards: DIN ISO 3497 and ASTM B 568

Approval: Fully protected instrument with type approval according to current
radiation protection legislation

Sample Stage
Design: Fixed sample support
Max. sample weight [kg/lb] : 13/29

Usable sample placement area[mm/in]:310 x 320/
12.2 x 12.6

Max. sample height [mm/in]: 90/3.5

Dimensions
External dimensions, Width x depth x height [mm/in]:403 x 588 x 365/16 x 23.2 x 14.4
Weight [kg/lb]: approx. 45/99
X-Ray Source:Micro-focus tungsten tube with beryllium
window
High voltage, three steps: 30, 40, 50 kV
Max. anode current: 1 mA

Primary filter, Material and
thickness [µm/mils]: fixed Al 500/19.7

Aperture (Collimator)Ø [mm/mils]: Fixed Standard 1,0/39
Option 0.6/24;
1.0/39 or 2.0/79

Smallest measurement spot*
Ø [mm/mils]: approx. 0.7/28*
* depends on the measuring distance and on the aperture, the actual measurement spot size
is shown in the video image

X-Ray Detection
Detector type:Silicon Drift Detector (SDD), peltier-cooled

Resolution fwhm for Mn-Kα [eV] ≤ 160

Element range: Al (13) to U (92)

Measuring distance [mm/in]: 0 – 25/0 – 1, Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Repeatability for gold,measurement time 60 sec: ≤ 0,5 ‰with aperture 1.0 mm

Incl. Gold Setup GOLDSCOPE with factory-calibrated measuring applications for gold and jewelry
Special GOLDSCOPE SD product modification and technical consultation on request

WinFTM® is a registered trademark of Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen – Germany.
Windows® is a registered trademark of Microsoft Corporation in the United States and other countries.

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