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HomeProductsGoldscope SD550
RS2404_X-RAY_GOLDSCOPE_SD Pro_SDD_SDD Pro_mit Schlagschatten
XRF Gold Testing Machine
RS2404_X-RAY_GOLDSCOPE_SD Pro_SDD_SDD Pro_mit Schlagschatten
Gold Testing Machine

Goldscope SD550

X-Ray Fluorescence Measuring Instruments
Optimized for Fast, Cost-effective and Non-destructive
Analysis of Jewelry, Coins and Precious Metals

Hallmarking centers,
jewelry manufacturing,
assaying offices

The X-ray fluorescence measuring instruments of the GOLDSCOPE SD series are optimized
for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals.
Furthermore, the instruments are well suited for determining the thickness of gold coatings
on sterling silver and rhodium coatings on gold alloys.
The GOLDSCOPE SD series comprises four different instruments to fulfill the specific
demands from the fast purchase and sale of gold up to the high-precision analysis of
precious metals.
Typical fields of application are the analysis of:
• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
Outstanding accuracy and long-term stability are characteristics of all X-RAY systems from
FISCHER. The necessity of recalibration is considerably reduced, saving time and effort. For even higher resolution,
the GOLDSCOPE SD 520 and SD 550 instruments with their Silicon Drift Detectors (SDD) are
available. The fundamental parameter method by FISCHER allows for the analysis without calibration.
The GOLDSCOPE SD instruments are designed as user-friendly bench-top instruments. Due to their compact design, the instruments are lightweight and require only little space. For quick and easy sample positioning, the X-ray source and detector assembly is located in the instrument‘s lower chamber. The measuring direction is from underneath the sample,
which is supported by a transparent window.
The integrated video-microscope with zoom and crosshairs simplifies sample placement and
allows for a precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear presentation of
measurement data is performed on a PC, using the powerful and user-friendly WinFTM
All GOLDSCOPE SD instruments fulfill DIN ISO 3497 and ASTM B 568.®

General Specification
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals

GOLDSCOPE SD 550: Bench top unit with upwards opening hood

Measuring direction: Bottom up

Electrical Data

Power supply and consumption: AC 115 or 230 V, 50/60 Hz, max. 120 W without evaluation PC

Protection class: IP40

Environmental Conditions
Operating temperature: 10 °C – 45 °C / 50 °F – 113 °F
Storage/Transport temperature: 0 °C – 50 °C / 32 °F – 122 °F
Relative humidity: ≤ 95 %

Sample Alignment
Sample positioning: Manually
Video microscope: High-resolution CCD color camera for optical monitoring of the measurement location
along the primary beam axis, Crosshairs with a calibrated scale (ruler) and spot-indicator,
Adjustable LED illumination
Zoom factor Digital: 1x, 2x, 3x, 4x

Evaluation Unit
Computer: Windows®-PC
Software: WinFTM® optimized for GOLDSCOPE SD, including Gold Setup GOLDSCOPE with
measuring applications for gold and jewelry


CE approval: EN 61010, EN 61326

X-Ray standards: DIN ISO 3497 and ASTM B 568

Approval: Fully protected instrument with type approval according to current
radiation protection legislation

Sample Stage
Design: Fixed sample support
Max. sample weight [kg/lb] : 13/29

Usable sample placement area[mm/in]:310 x 320/
12.2 x 12.6

Max. sample height [mm/in]: 90/3.5

External dimensions, Width x depth x height [mm/in]:403 x 588 x 365/16 x 23.2 x 14.4
Weight [kg/lb]: approx. 45/99
X-Ray Source:Micro-focus tungsten tube with beryllium
High voltage, three steps: 10, 30, 50 kV
Max. anode current: 1 mA
Primary filter, Material and
thickness [µm/mils]:6x changeable

Ni 10/0.4
no filter
Al 1000/39.4
Al 500/19.7
Al 100/3.9


Aperture (Collimator)Ø [mm/mils]:4x changeable:
0.2/8; 0.6/24;
1.0/39; 2.0/79

Smallest measurement spot*
Ø [mm/mils]: approx. 0.3 /12*
* depends on the measuring distance and on the aperture, the actual measurement spot size
is shown in the video image

X-Ray Detection
Detector type:Silicon Drift Detector (SDD), peltier-cooled

Resolution fwhm for Mn-Kα [eV] ≤ 160

Element range: Al (13) to U (92)

Measuring distance [mm/in]: 0 – 25/0 – 1, Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Repeatability for gold,measurement time 60 sec: ≤ 0,5 ‰with aperture 1.0 mm

Incl. Gold Setup GOLDSCOPE with factory-calibrated measuring applications for gold and jewelry
Special GOLDSCOPE SD product modification and technical consultation on request

WinFTM® is a registered trademark of Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen – Germany.
Windows® is a registered trademark of Microsoft Corporation in the United States and other countries.


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